| Citation | Rigoberto Juarez-Salazar, Sofia Esquivel-Hernandez, and Victor H. Diaz-Ramirez, “Optical fringe projection: a straightforward approach to 3D metrology” Metrology, Vol. 5, Issue 3, 47 (2025). DOI: https://doi.org/10.3390/metrology5030047 |
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What is it about? Español
Fringe projection allows contactless reconstruction of 3D objects with high fidelity and accuracy. Currently, “fringe projection” refers to numerous techniques that have emerged from diverse fringe-pattern analysis methods and the different optical setup alternatives. Thus, inexperienced readers may feel overwhelmed by the abundance of specialized books and scientific articles available today. Given this situation, this paper aims to provide the fundamental knowledge for setting up and operating a fringe projection profilometer from scratch. It offers practical learning for engaging effectively with specialized literature and research projects.
Why is it important?
Most of the existing literature on fringe projection assumes that readers already have prior knowledge of this subject. This assumption impedes beginners and professionals from learning, operating, or developing this technology efficiently. This paper provides readers with helpful insights and fundamental knowledge to construct and operate a fringe projection system and learn from the experience.
Perspectives
This paper reviews fundamental topics that practitioners would need to set up a fringe projection profilometer for the first time. Helpful insights explaining challenging and confusing concepts are provided. We hope this paper expands the reader’s understanding and stimulates further research, driving 3D metrology toward new frontiers.